Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage
Patent
1986-12-22
1989-04-04
James, Andrew J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Frequency of cyclic current or voltage
357 2, 357 30, 357 45, 357 32, 357 51, 357 237, 324158T, H01L 2712, H01L 2714, H01L 2904, H01L 2978
Patent
active
048190381
ABSTRACT:
An array of thin film transistor (TFT) devices is provided with a conductive region, such as a strip, for temporarily coupling a floating pel eletrode of each of the plurality of TFT devices to a conductor on an underlying substrate. The conductor may be a row or column metalization line associated with an adjacent row or column of the array. The conductive strip may therefore be utilized, in conjunction with appropriate voltage potentials and test circuitry, to test each of the TFT devices prior to the final fabrication of the TFT array into a completed flat panel display. Thus, nonfunctioning or out of specification arrays may be identified at an early point in the manufacturing cycle of the display. The strip may be comprised of amorphous silicon which is illuminated during the test in order to reduce the intrinsic resistance of the strip. The strip may also be comprised of a layer of metalization, which layer is removed from the array at the completion of the test.
REFERENCES:
patent: 3930304 (1976-01-01), Keller et al.
IBM Corporation
Jackson Jerome
James Andrew J.
LandOfFree
TFT array for liquid crystal displays allowing in-process testin does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with TFT array for liquid crystal displays allowing in-process testin, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and TFT array for liquid crystal displays allowing in-process testin will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-183066