TFI probe I/O wrap test method

Details TFI probe I/O wrap test method TFI probe I/O wrap test method

2006-03-07

2006-03-07

Arbes, Carl J. (Department: 3729)

Metal working

Method of mechanical manufacture

Electrical device making

C029S407010, C029S825000, C029S846000

Reexamination Certificate

active

07007380

ABSTRACT:
A method for testing external connections to semiconductor devices. The method includes providing an external electrical path between selected external connections on the semiconductor devices.

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