Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reissue Patent
2008-05-20
2008-05-20
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S626000
Reissue Patent
active
11140528
ABSTRACT:
A system for determining a composite signal level at which a signal path begins to generate non-linear distortiondelete-start id="DEL-S-00001" date="20080520" ?. Adelete-end id="DEL-S-00001" ?insert-start id="INS-S-00001" date="20080520" ?uses ainsert-end id="INS-S-00001" ?reference test signaldelete-start id="DEL-S-00002" date="20080520" ?, which is preferably a short-duration burst of repeatable broadband energy,delete-end id="DEL-S-00002" ?insert-start id="INS-S-00002" date="20080520" ?thatinsert-end id="INS-S-00002" ?is passed through the signal path and received on a digital signal acquisition unit. An impaired received reference test signaldelete-start id="DEL-S-00003" date="20080520" ?is comprised ofdelete-end id="DEL-S-00003" ?insert-start id="INS-S-00003" date="20080520" ?is formed frominsert-end id="INS-S-00003" ?the transmitted reference test signal, linear distortion components, and non-linear distortion components.delete-start id="DEL-S-00004" date="20080520" ?The impaired received reference test signal is digitally processed to reveal the non-linear distortion components. The impaired received reference test signal may be processed with a stored reference test signal to find a time-domain impulse response from which the uncorrelated distortion energy can be measured. Alternately, a reference test signal, such as an orthogonal frequency division multiplex (OFDM) reference signal with spectral holes, can be processed in the frequency domain to find the non-linear distortion energy that enters the spectral holes. Alternately, a transfer function of a signal path, showing an output voltage as a function of an input voltage, can be generated from a two-burst waveform comprised of a clipping high-level sinewave and non-clipping low-level sinewave. As the reference test signals are elevated in level, the magnitude of the non-linear distortion products can typically be observed to increase.delete-end id="DEL-S-00004" ?
REFERENCES:
patent: 5742591 (1998-04-01), Himayat et al.
patent: 5748001 (1998-05-01), Cabot
patent: 2001/0026596 (2001-10-01), Orihashi et al.
patent: 2003/0081705 (2003-05-01), Miller
Testing Cable Return Plant for Clipping-Use of a High-Speed Digital Oscilloscope-by Tom Williams, Spec Technology Publication of Cable Television Laboratories, Sep. 1996, vol. 8, No. 6.
Alta Vocal Data, LLC
Foley & Lardner LLP
Nguyen Vincent Q.
LandOfFree
Tests for non-linear distortion using digital signal processing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Tests for non-linear distortion using digital signal processing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Tests for non-linear distortion using digital signal processing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3926454