Testing system for semiconductor device without influence of def

Details Testing system for semiconductor device without influence of def Testing system for semiconductor device without influence of def

1997-06-25

1999-07-27

Palys, Joseph E.

Excavating

324765, G01R 3128

Patent

active

059302690

ABSTRACT:
A testing system selectively activates products of a semiconductor integrated circuit device mounted on a burn-in board, supplies test data signals to the products to see whether or not a defective product is mixed into the products, and a power distributor incorporated in the testing system supplies electric power only to the activated products so that non-activated products do not affect the test data signals.

REFERENCES:
patent: 5235600 (1993-08-01), Edwards
patent: 5343478 (1994-08-01), James et al.
patent: 5519713 (1996-05-01), Baeg et al.
patent: 5546407 (1996-08-01), Komatsu
patent: 5581562 (1996-12-01), Lin et al.
patent: 5617420 (1997-04-01), Whetsel
patent: 5617531 (1997-04-01), Crouch et al.

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