Testing system and testing method for inspecting electonic...

Details Testing system and testing method for inspecting electonic... Testing system and testing method for inspecting electonic...

2008-09-30

2011-10-04

Toatley, Gregory J (Department: 2877)

Image analysis

Applications

Manufacturing or product inspection

C382S145000, C382S152000

Reexamination Certificate

active

08031930

ABSTRACT:
A testing system for inspecting electronic devices includes a first transparent disk, a first image capturing unit disposed under the first transparent disk, a second disk disposed next to the first transparent disk, a guiding unit disposed on adjacent area between the transparent disk and the second disk, and a plurality of second image capturing units disposed around the second disk. A plurality of electronic devices is continuingly supplied onto the first transparent disk and the first image capturing unit is used for capturing the images of the bottom surfaces of the electronic devices. Then, the electronic devices are guided to the second disk via the guiding unit and the second image capturing units are used for capturing the images of other surfaces of the electronic devices. A testing method for electronic devices is further disclosed.

REFERENCES:
patent: 3651937 (1972-03-01), Kronseder
patent: 3716136 (1973-02-01), Birner et al.
patent: 4691231 (1987-09-01), Fitzmorris et al.
patent: 5721386 (1998-02-01), Marette
patent: 7261197 (2007-08-01), Nickey et al.
patent: 7438192 (2008-10-01), Kohler et al.

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