Testing system and testing method for DUTs

Details Testing system and testing method for DUTs Testing system and testing method for DUTs

2006-09-12

2006-09-12

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S073100

Reexamination Certificate

active

07106083

ABSTRACT:
A device characteristic testing system for testing a first DUT (device under test), a second DUT, a third DUT and a fourth DUT on a wafer, each of the DUTs includes a first end and a second end, the device characteristic testing system includes: a device characteristic testing circuit formed on the wafer includes a first conducting line connected to the second end of the first and the fourth DUT, a second conducting line connected to the second end of the second and third DUTs, a third conducting line connected to the first end of the first and second DUTs, a fourth conducting line connected to the first end of the third and fourth DUT, and a plurality of testing pads respectively coupled to the first, second, third, and fourth conducting line for receiving at least one testing signal to detect device characteristics of the DUTs.

REFERENCES:
patent: 5389556 (1995-02-01), Rostoker et al.
patent: 5442282 (1995-08-01), Rostoker et al.
patent: 5898186 (1999-04-01), Farnworth et al.
patent: 6759865 (2004-07-01), Gu et al.

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