Testing system and method for testing an electronic device

Details Testing system and method for testing an electronic device Testing system and method for testing an electronic device

2008-05-28

2009-10-27

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S073100

Reexamination Certificate

active

07609081

ABSTRACT:
A testing system for measuring an electronic device includes a main controller for generating a control signal, a signal generator for outputting a predetermined test input signal according to the control signal, an instrument unit having a plurality of instruments, and a testing port having a plurality of probes. The plurality of probes connects corresponding testing points of the electronic device to the signal generator and the instruments. The predetermined test input signal is transmitted to the electronic device via the testing port. The instrument unit processes a test result signal outputted by the electronic device and outputs a result data. The main controller receives the result data and computes whether the result data is within a predetermined range. A related testing method is also provided.

REFERENCES:
patent: 4392107 (1983-07-01), Gollomp
patent: 6766485 (2004-07-01), Sakaguchi
patent: 7132844 (2006-11-01), Hashimoto

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