Testing system

Details Testing system Testing system

1983-03-14

1986-04-15

Atkinson, Charles E.

Excavating

324 73R, 371 25, G01R 3128

Patent

active

045832234

ABSTRACT:
A first signal generator and a second signal generator for setting measuring conditions of a connection pin of a device under test are disposed in each of a number of signal transmission circuits. Each of the signal generators stores therein information for setting a measuring condition in the form of a digital data, which is D-A converted, and this D-A converted output determines the measuring condition. Analog switches are disposed for selecting as a measuring condition of the connection pin either the D-A converted output of the first signal generator or that of the second signal generator. A first discriminator and a second discriminator for discriminating the quality of measured results of the connection pin of the device under test are disposed in each of the signal transmission circuits. In each of the discriminators, reference value information for discriminating the quality is stored in the form of digital data, which is D-A converted, and this D-A converted output and a measured result of the connection pin are compared with each other. A controller controls the operation of each of the signal transmission circuits.

REFERENCES:
patent: 3492572 (1970-01-01), Jones et al.
patent: 4055801 (1977-10-01), Pike et al.
patent: 4102491 (1978-07-01), DeVito et al.
patent: 4168527 (1979-09-01), Winkler
patent: 4236246 (1980-11-01), Skilling
patent: 4270178 (1981-05-01), Lillig
Barnard et al, Integrated Circuit Test System, IBM Technical Disclosure Bulletin, vol. 14, No. 4, p. 1067, 9/71.
Chrisfield et al., OV/UV Detection Circuitry, IBM Technical Disclosure Bulletin, vol. 20, No. 9, p. 3589, 2/78.
GenRad's 2270: Your Total In-Circuit Solution, Technical Bulletin.

Affiliated with

Also associated with

Rating

Testing system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1443455