Testing set up and hold input timing parameters of high speed in

Details Testing set up and hold input timing parameters of high speed in Testing set up and hold input timing parameters of high speed in

1993-08-20

1994-10-18

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 251, G01R 3100

Patent

active

053571959

ABSTRACT:
A method and apparatus for testing input and output parameters for high speed integrated circuit devices. An integrated circuit tester generates a receive clock and a transmit clock using a pair of pre-selected output pins. The integrated circuit tester adjusts the phase relation between the transmit clock and the receive clock. Special circuitry within the device under test compares input and output data to detect errors.

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patent: 4811202 (1989-03-01), Schabowski
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patent: 4878209 (1989-10-01), Bassett et al.
patent: 4893072 (1990-01-01), Matsumoto
patent: 4929888 (1990-05-01), Yoshida
patent: 5083299 (1992-01-01), Schwanke et al.

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