Testing regime for a micro-electromechanical device

Details Testing regime for a micro-electromechanical device Testing regime for a micro-electromechanical device

2007-05-01

2007-05-01

Shah, Manish S. (Department: 2861)

Incremental printing of symbolic information

Ink jet

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C347S056000

Reexamination Certificate

active

11001025

ABSTRACT:
A method of testing a micro electro-mechanical device of a type having a support structure, an actuating arm that is movable relative to the support structure between a rest position and an operating position under the influence of heat inducing current flow through the actuating arm. A movement sensor is associated with the actuating arm that is activated by movement of the actuating arm to a predetermined position beyond the operating position. The method comprises the steps of: passing a series of current pulses of varying magnitude and/or duration through the actuating arm; determining the minimum magnitude and/or duration of the current pulse required to move the actuating arm to the predetermined position, and comparing the determined magnitude and/or duration with a desired magnitude and/or duration characteristic.

REFERENCES:
patent: 5455608 (1995-10-01), Stewart et al.
patent: 6264302 (2001-07-01), Imanaka et al.
patent: 6322194 (2001-11-01), Silverbrook
patent: 6382779 (2002-05-01), Silverbrook
patent: 6540319 (2003-04-01), Silverbrook
patent: 6890052 (2005-05-01), Silverbrook
patent: 2004/0036731 (2004-02-01), Ready et al.
patent: 0887186 (1998-12-01), None
patent: WO 9903680 (1998-01-01), None
patent: WO 9903681 (1999-01-01), None
Design, Fabrication, and Teting of a C-Shape Actuator; G Lin, CJ Kim, S Konishi, H Fujita; IfM, Louisiana Tech Univ., PO Box 10348, Rustom, LA 71272, USA; Mane Dept, UCLA, Los Angeles, CA 90095, USA; IIS, Univ of Tokyo, Roppongi, Minato-ku, Tokyo, 106 Japan.

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