Testing process for electronic devices

Details Testing process for electronic devices Testing process for electronic devices

1990-09-05

1991-06-11

Strecker, Gerard R.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324690, 324 731, G01R 1512

Patent

active

050235575

ABSTRACT:
Electronic devices such as hybrid integrated circuits such as those having test points spaced less than 1250 .mu.m are advantageously evaluated utilizing a two-probe process. In this process the probes are moved between test points in a pattern that reduces movement distance without concern for any ordering imposed by the nets themselves or the test to be made. Additionally, the test is made so that the movement time is the limiting factor.

REFERENCES:
patent: 3695680 (1976-08-01), Webb
patent: 4565966 (1986-01-01), Burr et al.
A.J. Diefenderfer, Principles of Electronic Instrumentation, W. B. Saunders Company, Phila., PA, 1979.

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