Testing pattern-based applications

Data processing: software development – installation – and managem – Software program development tool – Testing or debugging

Reexamination Certificate

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Details

C717S105000, C717S109000, C717S113000, C715S762000

Reexamination Certificate

active

07913231

ABSTRACT:
Methods and apparatus, including computer program products, implement techniques for testing applications using configurable patterns. A test script is received for a pattern that includes a predefined arrangement of user interface elements and specifies predefined actions that can be performed using the user interface elements. The test script specifies test sequences operable to invoke one or more of the predefined actions that can be performed. A specification of an application is received, where the specification includes configuration data for the pattern. The configuration data specifies associations between one or more of the user interface elements and one or more entities in a back-end system. A generated application-specific test is operable to invoke one or more of the predefined actions according to the test sequences in the test script. The predefined actions use the entities in the back-end system with which the user interface elements are associated.

REFERENCES:
patent: 5475843 (1995-12-01), Halviatti et al.
patent: 5495571 (1996-02-01), Corrie et al.
patent: 5754755 (1998-05-01), Smith, Jr.
patent: 5781720 (1998-07-01), Parker et al.
patent: 6002871 (1999-12-01), Duggan et al.
patent: 6185701 (2001-02-01), Marullo et al.
patent: 6522995 (2003-02-01), Conti et al.
patent: 6741967 (2004-05-01), Wu et al.
patent: 6772083 (2004-08-01), Muller et al.
patent: 6854089 (2005-02-01), Santee et al.
patent: 6898764 (2005-05-01), Kemp
patent: 6948152 (2005-09-01), Dubovsky
patent: 6983421 (2006-01-01), Lahti et al.
patent: 7058857 (2006-06-01), Dallin
patent: 7080118 (2006-07-01), Hildebrand
patent: 7099893 (2006-08-01), Bischof et al.
patent: 7117411 (2006-10-01), McNeely et al.
patent: 7124401 (2006-10-01), Muller et al.
patent: 7143365 (2006-11-01), Gallella
patent: 7165241 (2007-01-01), Manda et al.
patent: 7174541 (2007-02-01), Muller et al.
patent: 7231606 (2007-06-01), Miller et al.
patent: 7249148 (2007-07-01), Ehrich et al.
patent: 7305659 (2007-12-01), Muller et al.
patent: 7313564 (2007-12-01), Melamed et al.
patent: 7369975 (2008-05-01), Ramanathan et al.
patent: 7421683 (2008-09-01), Robertson et al.
patent: 7434203 (2008-10-01), Stienhans et al.
patent: 7526498 (2009-04-01), Dubovsky
patent: 7552424 (2009-06-01), Bischof et al.
patent: 2002/0026441 (2002-02-01), Kutay et al.
patent: 2002/0162059 (2002-10-01), McNeely et al.
patent: 2002/0186248 (2002-12-01), Ramanathan et al.
patent: 2002/0199025 (2002-12-01), Kutay et al.
patent: 2003/0023674 (2003-01-01), Hildebrand
patent: 2003/0055836 (2003-03-01), Dubovsky
patent: 2003/0231203 (2003-12-01), Gallella
patent: 2003/0236775 (2003-12-01), Patterson
patent: 2004/0001092 (2004-01-01), Rothwein et al.
patent: 2004/0003325 (2004-01-01), Muller et al.
patent: 2004/0041827 (2004-03-01), Bischof et al.
patent: 2004/0044992 (2004-03-01), Muller et al.
patent: 2004/0044993 (2004-03-01), Muller et al.
patent: 2004/0107415 (2004-06-01), Melamed et al.
patent: 2004/0111727 (2004-06-01), Schwarzbauer et al.
patent: 2005/0055667 (2005-03-01), Beringer et al.
patent: 2005/0071447 (2005-03-01), Masek et al.
patent: 2005/0223360 (2005-10-01), Seeman et al.
patent: 2005/0229161 (2005-10-01), Wang et al.
patent: 2006/0101404 (2006-05-01), Popp et al.
patent: 2007/0089091 (2007-04-01), Larab et al.
patent: 2008/0320462 (2008-12-01), Bergman et al.
patent: 2009/0217250 (2009-08-01), Grechanik et al.

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