Testing of semiconductor integrated circuits

Details Testing of semiconductor integrated circuits Testing of semiconductor integrated circuits

1996-08-01

1998-08-11

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3102

Patent

active

057932190

ABSTRACT:
A semiconductor integrated circuit is tested such that probe styli are brought into contact with electrodes on integrated circuit chips formed in a semiconductor wafer to test circuit characteristics of the integrated circuit chips. A test is conducted over a given number of integrated circuit chips. A fraction defective over the given number of integrated circuit chips is calculated as a result of the test conducted. Probe pressure with which the probe styli contact the electrodes on the integrated circuit chips is controlled on the basis of the calculated fraction defective.

REFERENCES:
patent: 4994735 (1991-02-01), Leedy

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