Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-05-08
1997-04-22
Karlsen, Ernest F.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
G01R 3126
Patent
active
056232152
ABSTRACT:
A method and an apparatus for testing semiconductor devices, especially overvoltage protectors, involves the application to the device to be tested of a standard surge waveform which is truncated by terminating it early. The amount of heating of the device by the truncated surge waveform is ascertained by monitoring or measuring a heat sensitive parameter of the device during and/or shortly after the application of the waveform. Devices which undergo less heating are capable of withstanding higher electrical loads in service than those which become more heated. The early termination is effected by a controllable short circuit operating on the standard waveform. The differential coefficient with respect to time of a heat sensitive parameter may be monitored continually during the truncated waveform and used to operate the short circuit even earlier if the differential coefficient exceeds a threshold value indicating an undue temperature rise in the device.
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Donaldson Richard L.
Karlsen Ernest F.
Kempler William B.
Kobert Russell M.
Texas Instruments Incorporated
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