Testing of semiconductor chips

Details Testing of semiconductor chips Testing of semiconductor chips

1995-11-29

1999-05-25

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, G01R 3102

Patent

active

059072466

ABSTRACT:
A method and apparatus for testing of semiconductor chips. The method and apparatus having a fixture which includes electrical contacts and thermal contacts. The electrical contacts are configured to drive each of the chips in an operating or stressed condition. The thermal contacts are configured to maintain the chip at a desired temperature during testing.

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patent: 4115736 (1978-09-01), Tracy
patent: 5012187 (1991-04-01), Littlebury
patent: 5210485 (1993-05-01), Kreiger et al.
patent: 5397997 (1995-03-01), Tuckerman et al.
patent: 5523696 (1996-06-01), Charlton et al.

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