Testing of integrated circuits including internal test circuitry

Details Testing of integrated circuits including internal test circuitry Testing of integrated circuits including internal test circuitry

1990-04-24

1992-06-02

Atkinson, Charles E.

Excavating

371 221, G01R 3128

Patent

active

051193787

ABSTRACT:
Built-in test circuitry, which is appropriate for monolithic integrated circuit chips that are to be connected in a plural-chip package, uses electronic token passing to select one of the test input ports in the circuitry to be tested for application of test input vectors. The built-in test circuitry also uses electronic token passing to select one of the test output ports in the circuitry to be tested from which test results are to be supplied. Methods for testing based on these token passing procedures are described.

REFERENCES:
patent: 4701920 (1987-10-01), Resnick et al.
patent: 4740970 (1988-04-01), Burrows et al.
patent: 4910735 (1990-03-01), Yamashita
patent: 4914379 (1990-04-01), Maeno
patent: 5006787 (1991-04-01), Katircioglu et al.

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