Testing of embedded systems

Details Testing of embedded systems Testing of embedded systems

2005-03-04

2009-11-24

Feliciano, Eliseo Ramos (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

C702S117000, C702S188000, C702S189000

Reexamination Certificate

active

07623981

ABSTRACT:
An embedded device testing system for comparing actual device under test input/output vector pairs with modelled device under test input/output vector pairs, wherein actual device under test output vectors are sampled in accordance with a predefined timing reference.

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“Search Report for International Application No. PCT/AU2005/00313”, (Apr. 6, 2005).

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