Testing of electronic circuits which typically contain asynchron

Details Testing of electronic circuits which typically contain asynchron Testing of electronic circuits which typically contain asynchron

1994-07-15

1997-04-22

Beausoliel, Jr., Robert W.

Excavating

G01R 3128

Patent

active

056235020

ABSTRACT:
An electronic circuit containing a plurality of functional elements also contains a like plurality of corresponding test elements used in testing the functional elements. Aside from being transparent to the functional elements during normal circuit operation, the test elements are internally switchable to provide the circuit with real-time observability through a circuit test output, real-time controllability, and state controllability. Functional elements formed with asynchronous digital circuitry can thereby be tested with the test elements.

REFERENCES:
patent: 4995039 (1991-02-01), Sakashita et al.
patent: 5166604 (1992-11-01), Ahanin et al.
patent: 5260949 (1993-11-01), Hashizume et al.

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