Testing of circuit arrangements

Details Testing of circuit arrangements Testing of circuit arrangements

1979-05-31

1981-09-29

Yokar, Michael J.

Electricity: measuring and testing

Plural, automatically sequential tests

324 73PC, 324 51, G01R 1512

Patent

active

042925860

ABSTRACT:
Testing of thin film modules is facilitated by employing predetermined test procedures, so that analysis of the results is facilitated; and the test signals are supplied to, and the corresponding output signals are supplied from, the module terminals, a predetermined interface printed circuit board being connected to these terminals for this purpose, and so that electrical and mechanical damage to the module is obviated during the test procedures.

REFERENCES:
patent: 3777129 (1973-12-01), Mehia
patent: 4058767 (1977-11-01), Muehldorf
patent: 4108358 (1978-08-01), Niemaszyk
patent: 4114093 (1978-09-01), Long
patent: 4139818 (1979-02-01), Schneider

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