Testing of a system-on-a-chip having a programmable section...

Details Testing of a system-on-a-chip having a programmable section... Testing of a system-on-a-chip having a programmable section...

2006-06-08

2008-09-02

Karlsen, Ernest F (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C714S733000

Reexamination Certificate

active

07420384

ABSTRACT:
Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces begins by configuring the programmable section to support a 1stlevel testing of the plurality of high-speed interfaces. The testing continues by testing one of the plurality of high-speed interfaces at the 1stlevel of testing via the programmable section. The testing continues by evaluating the tested performance characteristics in accordance with the prescribed performance characteristics of the standard to determine whether the one of the plurality of high-speed interfaces conforms with the standard requirements. When the one of the plurality of high-speed interfaces conforms with the standard requirements, the plurality of high-speed interfaces are configured for a 2ndlevel testing, where the 1stlevel testing is more stringent than the 2ndlevel testing. The testing continues by testing, at the 2ndlevel, remaining ones of the plurality of high-speed interfaces.

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