Testing multiple IC in parallel by a single IC tester

Details Testing multiple IC in parallel by a single IC tester Testing multiple IC in parallel by a single IC tester

1994-09-26

1997-04-22

Wieder, Kenneth A.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324754, G01R 104

Patent

active

056232020

ABSTRACT:
A single IC testing machine can be used to test several IC chips connected in parallel by a unique hardware design and a special software program for execution, for instance, a single testing head and a single set of address input lines can be used for testing the chips by connecting the corresponding similar address input pins of the chips together first and then connecting to the address input lines of the testing machine, and connecting the data I/O pins of the chips to the data I/O pins of the testing machine, and then connecting the voltage input and the ground of the chips to separate voltage sources.

REFERENCES:
patent: 4459693 (1984-07-01), Prang et al.
patent: 5208529 (1993-05-01), Tsurishima et al.
patent: 5396185 (1995-03-01), Honma et al.
patent: 5404099 (1995-04-01), Sahara

Affiliated with

Also associated with

Rating

Testing multiple IC in parallel by a single IC tester does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing multiple IC in parallel by a single IC tester, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing multiple IC in parallel by a single IC tester will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-343772