Testing micromirror devices

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

Reexamination Certificate

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Reexamination Certificate

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07847538

ABSTRACT:
An array of individually addressable micromirrors is characterized by sending a driving signal to a pixel group having a fewer number of micromirrors. A response of the micromirrors in the group is measured; and the micromirror array is characterized based upon at least the measured response.

REFERENCES:
patent: 5706123 (1998-01-01), Miller et al.
patent: 6201521 (2001-03-01), Doherty
patent: 6480177 (2002-11-01), Doherty et al.
patent: 6496028 (2002-12-01), Manhaeve et al.
patent: 6788416 (2004-09-01), Reuter
patent: 6889156 (2005-05-01), Pillai
patent: 6937382 (2005-08-01), Shih
patent: 6985278 (2006-01-01), Chu et al.
patent: 2004/0042000 (2004-03-01), Mehrl et al.
patent: 2004/0114206 (2004-06-01), Pillai

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