Testing method utilizing at least one signal between...

Details Testing method utilizing at least one signal between... Testing method utilizing at least one signal between...

2008-05-20

2008-05-20

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010

Reexamination Certificate

active

11164028

ABSTRACT:
A testing method utilizing at least one signal between ICs includes: coupling at least one testing device to a plurality of ICs that are capable of being tested by the testing device, the ICs including at least a first IC and a second IC; coupling the second IC to the first IC to utilize at least one output signal of the first IC to be at least one input signal of the second IC; and testing the second IC by utilizing the testing device and the output signal of the first IC.

REFERENCES:
patent: 6721913 (2004-04-01), Azimi
patent: 6825683 (2004-11-01), Berndt et al.

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