Excavating
Patent
1993-05-17
1995-11-28
Cosimano, Edward R.
Excavating
324 731, 371 221, 371 251, 371 27, G06F 1125
Patent
active
054714818
ABSTRACT:
A method of testing an electronic apparatus which eliminates a control signal line for setting an integrated circuit to a test mode and a test mode select terminal of an external terminal section and wherein fetching of test data and transfer of the thus fetched test data are performed in an integrated operation. In each of the integrated circuits, a boundary scan control circuit discriminates a category code at the top of data inputted from a serial input terminal to control a pair of switching circuits. When the category code represents a test mode, predetermined terminals of the switching circuits are selected so that input data are sent out to boundary scan cells. Fetching of parallel data from parallel input terminals and transfer to the boundary scan cells are performed at a time.
REFERENCES:
patent: 4428060 (1984-01-01), Blum
patent: 4503537 (1985-03-01), McAnney
patent: 4519078 (1985-05-01), Komonytsky
patent: 4707833 (1987-11-01), Tamaru
patent: 4710931 (1987-12-01), Bellay et al.
patent: 4764926 (1988-08-01), Knight et al.
patent: 4847800 (1989-07-01), Daane
patent: 4860290 (1989-08-01), Daniels et al.
patent: 4872169 (1989-10-01), Whetsel, Jr.
patent: 4967142 (1990-10-01), Sauerwald et al.
patent: 5029166 (1991-07-01), Jarwala et al.
patent: 5109190 (1992-04-01), Sakashita et al.
patent: 5270642 (1993-12-01), Parker
patent: 5285152 (1994-02-01), Hunter
patent: 5321277 (1994-06-01), Sparks et al.
Fukuda Tokuya
Matsuno Katsumi
Okumoto Koji
Senuma Toshitaka
Shiono Toru
Cosimano Edward R.
Frommer William S.
Sinderbrand Alvin
Sony Corporation
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