Testing method for a head IC

Details Testing method for a head IC Testing method for a head IC

2006-05-30

2006-05-30

Kim, Paul (Department: 3729)

Metal working

Method of mechanical manufacture

Electrical device making

C029S603050, C029S603060, C324S210000, C324S212000, C360S244100, C360S244200, C360S245800

Reexamination Certificate

active

07051423

ABSTRACT:
This invention relates to a testing method for a head IC which makes it possible to simplify checking of the head. The head IC is installed on a head suspension, and probes are placed on terminals of the head suspension to check electric characteristics of the head IC. With this invention, contact of the probes for checking the head IC when the head IC has been installed, but before installing the head, becomes easier.

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“Monolithic sampling head IC”; Miura, A.; Yakihara, T.; Uchida, S.; Oka, S.; Kobayashi, S.; Kamada, H.; Dobashi, M.; Microwave Theory and Techniques, IEEE Transactions on vol. 38; Dec. 1990 pp.: 1980-1985.

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