Testing method and testing device for semiconductor...

Details Testing method and testing device for semiconductor... Testing method and testing device for semiconductor...

2005-04-12

2005-04-12

Tokar, Michael (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C345S087000

Reexamination Certificate

active

06879174

ABSTRACT:
The set values of the base power supply voltages are divided between 10 [V] and 0 [V], the upper limit value and the lower limit value of the drive voltage specification of a liquid crystal driver. A base power supply potential difference of 10 [V] between V1to V2of the base power supply terminals can be generated. By taking the gradation levels included between V1to V2of these base power supply terminals as test objects, each of the neighboring gradation output levels can mutually have a potential difference of about 200 [mV] (base power supply potential difference between the terminals 10000 [mV]/51 gradation levels). For the gradation levels included between these base power supply terminals, for every gradation level, test is performed while changing sequentially the input data and the setting of the judgment level of the comparator, and the gradation levels included in this interval are all tested.

REFERENCES:
patent: 6160533 (2000-12-01), Tamai et al.
patent: 63-165932 (1988-10-01), None
patent: 01-227525 (1989-09-01), None
patent: 05-173503 (1993-07-01), None
patent: 05-249920 (1993-09-01), None
patent: 07-326970 (1995-12-01), None
patent: 09-068692 (1997-11-01), None
patent: 2000-162281 (2000-06-01), None
patent: 2000-165244 (2000-06-01), None

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