Testing method and tester for semiconductor integrated...

Details Testing method and tester for semiconductor integrated... Testing method and tester for semiconductor integrated...

2006-08-29

2006-08-29

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S763010, C714S726000, C714S733000

Reexamination Certificate

active

07098682

ABSTRACT:
The invention relates to a test method and a test apparatus for a semiconductor integrated circuit device having a high-speed input/output device, and it has for its object to perform the test of the high-speed I/O exceeding 1 GHz, promptly by a simple board construction, without altering a test system for individual I/O specifications. A semiconductor integrated circuit device (1) having a high-speed input/output device (2) is set on a load board (3) which is provided with loopback paths (4) each connecting the external output terminal and external input terminal of the semiconductor integrated circuit device (1) by transmission lines, and the operation of the high-speed input/output device (2) is tested within the semiconductor integrated circuit device (1) by utilizing test means (5) disposed inside the semiconductor integrated circuit device (1), and the loopback paths (4).

REFERENCES:
patent: 6754867 (2004-06-01), Ojha et al.
patent: 6777971 (2004-08-01), Kirloskar et al.
patent: 6859902 (2005-02-01), Dalal et al.
patent: 2002/0145197 (2002-10-01), Ohta et al.
patent: 2002/0176236 (2002-11-01), Iguchi et al.
patent: 2003/0031133 (2003-02-01), Momtaz
patent: 2003/0221152 (2003-11-01), Volkerink et al.
patent: 2004/0250187 (2004-12-01), Schauer et al.
patent: 0 780 767 (1997-06-01), None
patent: 06-201780 (1994-07-01), None
patent: 09-189749 (1997-07-01), None
patent: 10-170606 (1998-06-01), None
patent: 11-64442 (1999-03-01), None
patent: 2000-171524 (2000-06-01), None
patent: 2001-194417 (2001-07-01), None

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