Testing memory access signal connections

Details Testing memory access signal connections Testing memory access signal connections

2006-02-14

2006-02-14

Assouad, Patrick J. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S117000, C702S118000, C714S727000, C714S734000, C714S718000

Reexamination Certificate

active

06999900

ABSTRACT:
In order to test the memory access signal connections between a data processing circuit, such as a processor core2, and a memory4, a subset of memory access signal connections8are provided with associated scan chain cells10so that they may be directly tested. The remainder memory access signal connections12which are common to all the expected configurations of the memory4are tested by being driven by the processor core2itself with data being passed through the memory and captured back within the processor core2for checking.

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