Testing integrated circuits

Details Testing integrated circuits Testing integrated circuits

1986-06-30

1988-08-30

Sikes, William L.

Coherent light generators

Particular component circuitry

Optical pumping

357 19, 357 32, 357 40, 357 45, 372 50, H01L 2714, H01L 3112, H01L 2702

Patent

active

047680733

ABSTRACT:
Integrated circuits are tested prior to separation from a processed wafer. ach circuit has photoreceivers coupled via metallization tracks to an adjacent circuit. The receivers are used for the input of high speed optical test signals. The intercircuit coupling tracks are severed when the wafer is scribed to separate the individual circuits thus removing the electrical parasitic effects of the receivers.

REFERENCES:
patent: 4297653 (1981-10-01), Scifres et al.

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