Testing integrated circuit using an A/D converter built in a sem

Details Testing integrated circuit using an A/D converter built in a sem Testing integrated circuit using an A/D converter built in a sem

1991-08-20

1993-02-02

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 225, G01R 3128

Patent

active

051841622

ABSTRACT:
A testing integrated circuit using an A/D converter provided in an integrated circuit on a semiconductor chip. A selector is provided for selecting either an external signal supplied from an external portion of the chip or an internal signal generated by an internal circuit of the chip, and for outputting the selected signal. The A/D converter, which receives an output from the selector, is normally used for A/D-converting an external signal. During reliability test, the A/D converter receives a signal to measure a voltage from the internal portion of the chip, and A/D-converts the received signal. An output pad which transmits the output of the A/D converter to the external portion is also used as a general output pad. The general output pad is employed to A/D-convert the external signal.

REFERENCES:
patent: 4789824 (1988-12-01), Henkelmann
Duncan, "A BiST Design Methodology Experiment", 1989 International Test Conference, 1989 IEEE, Paper 33.3, pp. 755-762.

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