Testing integrated circuit chips

Details Testing integrated circuit chips Testing integrated circuit chips

1996-12-13

2000-03-14

Ballato, Josie

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3102

Patent

active

060377860

ABSTRACT:
An interposer for making a penetrating temporary contact between the contact pads of a chip having bumped or unbumped I/O pads and a test board for the purpose of testing the chip is disclosed. The interposer comprises a silicon substrate having sharp penetrating structures integrally formed at a predetermined depth in the silicon substrate along crystallographic planes. The resultant apparatus has a matching lateral thermal expansion to the chip being tested and provides uniform contact to all chip I/O pads.

REFERENCES:
patent: 4937653 (1990-06-01), Blonder et al.
patent: 5073117 (1991-12-01), Mahli et al.
patent: 5118299 (1992-06-01), Burns et al.
patent: 5206585 (1993-04-01), Chang et al.
patent: 5374893 (1994-12-01), Koopman et al.
patent: 5419807 (1995-05-01), Akram et al.
patent: 5457344 (1995-10-01), Bartelink
patent: 5481205 (1996-01-01), Frye et al.
patent: 5500605 (1996-03-01), Chang
patent: 5523696 (1996-06-01), Charlton et al.
patent: 5528159 (1996-06-01), Charlton et al.
patent: 5541525 (1996-07-01), Wood et al.
patent: 5559444 (1996-09-01), Farnworth et al.
patent: 5578934 (1996-11-01), Wood et al.
IBM Technical Disclosure Bulletin, vol. 16, No. 7, Dec. 1973 pp. 2291 & 2292 Gaind et al. Process For Etching Silicon.

Affiliated with

Also associated with

Rating

Testing integrated circuit chips does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing integrated circuit chips, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing integrated circuit chips will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-172946