Testing input/output voltages in integrated circuits

Details Testing input/output voltages in integrated circuits Testing input/output voltages in integrated circuits

2006-10-17

2006-10-17

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C324S537000

Reexamination Certificate

active

07123039

ABSTRACT:
An integrated circuit (IC) measures a voltage at an interface of the IC. The IC comprises voltage reference, comparator, and control circuits. The voltage reference circuit provides reference voltages responsive to a control input. The comparator circuit compares a first reference voltage with a voltage at the interface. The control circuit receives an output of the comparator and adjusts the control input to provide a second reference voltage closer to the voltage at the interface. A method for measuring voltage at an IC interface comprises generating a first reference voltage, monitoring the voltage at the interface from within the IC, comparing the first reference and interface voltages, generating a second reference voltage responsive to a result of the comparing, replacing the first reference voltage with the second reference voltage, and repeating until an applied reference voltage is substantially equal to the voltage at the interface.

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