Testing high frequency signals on a trace

Details Testing high frequency signals on a trace Testing high frequency signals on a trace

2005-12-16

2009-02-10

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07489154

ABSTRACT:
A system, apparatus and method for testing and measuring high frequency signals on a trace is described. In one embodiment of the invention, a footprint is manufactured on a trace to allow the testing of a signal while reducing the amount of distortion caused by prior art structures and methods. The footprint is designed to reduce stub effects and capacitance on a signal being communicated on the trace.

REFERENCES:
patent: 7042241 (2006-05-01), Tervo et al.
patent: 7276922 (2007-10-01), Miller et al.
patent: 7334325 (2008-02-01), Roth et al.
patent: 7360308 (2008-04-01), Oggioni et al.

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