Testing fuse configurations in semiconductor devices

Details Testing fuse configurations in semiconductor devices Testing fuse configurations in semiconductor devices

2008-01-10

2011-11-22

Tang, Minh N (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

08063650

ABSTRACT:
Methods, systems, and apparatus for testing semiconductor devices. A semiconductor device includes one or more external terminals configured to receive fuse configuration data from an external source. The semiconductor device also includes a soft-blow circuit to generate a soft-blow signal based on the fuse configuration data, and a fuse circuit that includes a fuse and has first and second operational states corresponding to the fuse being intact and blown, respectively. The fuse circuit is configured to receive the soft-blow signal and to select its operational state to be the first or second operational state based on the received soft-blow signal.

REFERENCES:
patent: 4263650 (1981-04-01), Bennett et al.
patent: 4743841 (1988-05-01), Takeuchi
patent: 4773028 (1988-09-01), Tallman
patent: 4825414 (1989-04-01), Kawata
patent: 4873669 (1989-10-01), Furutani et al.
patent: 5151881 (1992-09-01), Kajigaya et al.
patent: 5251095 (1993-10-01), Miller et al.
patent: 5301156 (1994-04-01), Talley
patent: 5326428 (1994-07-01), Farnworth et al.
patent: 5388104 (1995-02-01), Shirotori et al.
patent: 5418452 (1995-05-01), Pyle
patent: 5457400 (1995-10-01), Ahmad et al.
patent: 5477545 (1995-12-01), Huang
patent: 5479105 (1995-12-01), Kim et al.
patent: 5506499 (1996-04-01), Puar
patent: 5523697 (1996-06-01), Farnworth et al.
patent: 5535165 (1996-07-01), Davis et al.
patent: 5594694 (1997-01-01), Roohparvar et al.
patent: 5604432 (1997-02-01), Moore et al.
patent: 5619461 (1997-04-01), Roohparvar
patent: 5657284 (1997-08-01), Beffa
patent: 5677885 (1997-10-01), Roohparvar
patent: 5719438 (1998-02-01), Beilstein, Jr. et al.
patent: 5751015 (1998-05-01), Corbett
patent: 5751987 (1998-05-01), Mahant-Shetti et al.
patent: 5801452 (1998-09-01), Farnworth et al.
patent: 5805609 (1998-09-01), Mote, Jr.
patent: 5807762 (1998-09-01), Akram et al.
patent: 5825697 (1998-10-01), Gilliam et al.
patent: 5825782 (1998-10-01), Roohparvar
patent: 5923600 (1999-07-01), Momohara
patent: 5925142 (1999-07-01), Raad et al.
patent: 5936260 (1999-08-01), Corbett et al.
patent: 5959310 (1999-09-01), Akram et al.
patent: 5966388 (1999-10-01), Wright et al.
patent: 5995379 (1999-11-01), Kyougoku et al.
patent: 6011720 (2000-01-01), Tanaka
patent: 6026039 (2000-02-01), Kim et al.
patent: 6047393 (2000-04-01), Yamada
patent: 6069483 (2000-05-01), Maxwell et al.
patent: 6072326 (2000-06-01), Akram et al.
patent: 6087676 (2000-07-01), Akram et al.
patent: 6100708 (2000-08-01), Mizuta
patent: 6100716 (2000-08-01), Adham et al.
patent: 6104658 (2000-08-01), Lu
patent: 6137167 (2000-10-01), Ahn et al.
patent: 6154860 (2000-11-01), Wright et al.
patent: 6157046 (2000-12-01), Corbett et al.
patent: 6188232 (2001-02-01), Akram et al.
patent: 6191603 (2001-02-01), Muradali et al.
patent: 6194738 (2001-02-01), Debenham et al.
patent: 6205082 (2001-03-01), Tomita et al.
patent: 6208157 (2001-03-01), Akram et al.
patent: 6216240 (2001-04-01), Won et al.
patent: 6216241 (2001-04-01), Fenstermaker et al.
patent: 6243839 (2001-06-01), Roohparvar
patent: 6243840 (2001-06-01), Raad et al.
patent: 6263463 (2001-07-01), Hashimoto
patent: 6274937 (2001-08-01), Ahn et al.
patent: 6286115 (2001-09-01), Stubbs
patent: 6294839 (2001-09-01), Mess et al.
patent: 6298001 (2001-10-01), Lee et al.
patent: 6300782 (2001-10-01), Hembree et al.
patent: 6310484 (2001-10-01), Akram et al.
patent: 6320201 (2001-11-01), Corbett et al.
patent: 6351681 (2002-02-01), Chih et al.
patent: RE37611 (2002-03-01), Roohparvar
patent: 6365421 (2002-04-01), Debenham et al.
patent: 6366487 (2002-04-01), Yeom
patent: 6370661 (2002-04-01), Miner
patent: 6392948 (2002-05-01), Lee
patent: 6395565 (2002-05-01), Akram et al.
patent: 6396291 (2002-05-01), Akram et al.
patent: 6407566 (2002-06-01), Brunelle et al.
patent: 6441479 (2002-08-01), Ahn et al.
patent: 6445625 (2002-09-01), Abedifard
patent: 6456099 (2002-09-01), Eldridge et al.
patent: 6457141 (2002-09-01), Kim et al.
patent: 6470484 (2002-10-01), Day et al.
patent: 6472747 (2002-10-01), Bazarjani et al.
patent: 6483760 (2002-11-01), Kang
patent: 6484279 (2002-11-01), Akram
patent: 6492727 (2002-12-01), Nishizawa et al.
patent: 6502215 (2002-12-01), Raad et al.
patent: 6507885 (2003-01-01), Lakhani et al.
patent: 6519171 (2003-02-01), Matsuzaki et al.
patent: 6519725 (2003-02-01), Huisman
patent: 6531339 (2003-03-01), King et al.
patent: 6675269 (2004-01-01), Miura et al.
patent: 6711042 (2004-03-01), Ishikawa
patent: 6732304 (2004-05-01), Ong
patent: 6762486 (2004-07-01), Inoue et al.
patent: 6791175 (2004-09-01), Matsuo et al.
patent: 6801461 (2004-10-01), Hii et al.
patent: 6812726 (2004-11-01), Ong
patent: 6825683 (2004-11-01), Berndt et al.
patent: 6882171 (2005-04-01), Ong
patent: 6967397 (2005-11-01), Inoue et al.
patent: 6996652 (2006-02-01), Ong
patent: 6996745 (2006-02-01), Shaylor
patent: 6996754 (2006-02-01), Lee
patent: 7006940 (2006-02-01), Ong
patent: 7030641 (2006-04-01), Tang et al.
patent: 7053470 (2006-05-01), Sellers et al.
patent: 7061263 (2006-06-01), Ong
patent: 7075175 (2006-07-01), Kazi et al.
patent: 7133798 (2006-11-01), Ong
patent: 7139945 (2006-11-01), Ong
patent: 7149135 (2006-12-01), Okuno
patent: 7240254 (2007-07-01), Ong
patent: 7245141 (2007-07-01), Ong
patent: 7259582 (2007-08-01), Ong
patent: 7265570 (2007-09-01), Ong
patent: 7269524 (2007-09-01), Ong et al.
patent: 7269765 (2007-09-01), Charlton et al.
patent: 7305595 (2007-12-01), Goodwin et al.
patent: 7307442 (2007-12-01), Ong
patent: 7309999 (2007-12-01), Ong
patent: 7310000 (2007-12-01), Ong
patent: 7313740 (2007-12-01), Ong
patent: 7365557 (2008-04-01), Ong
patent: 7370256 (2008-05-01), Ong
patent: 7404117 (2008-07-01), Ong et al.
patent: 7425840 (2008-09-01), Jang
patent: 7444575 (2008-10-01), Ong
patent: 7446551 (2008-11-01), Ong
patent: 7466160 (2008-12-01), Ong et al.
patent: 7593271 (2009-09-01), Ong
patent: 7673193 (2010-03-01), Ong
patent: 7779311 (2010-08-01), Ong
patent: 2002/0017720 (2002-02-01), Nishizawa et al.
patent: 2002/0117729 (2002-08-01), Aiki et al.
patent: 2003/0235929 (2003-12-01), Cowles et al.
patent: 2004/0019841 (2004-01-01), Ong
patent: 2004/0027150 (2004-02-01), Miura et al.
patent: 2004/0100296 (2004-05-01), Ong
patent: 2004/0150089 (2004-08-01), Inoue et al.
patent: 2004/0196709 (2004-10-01), Ong
patent: 2004/0232559 (2004-11-01), Adelmann
patent: 2005/0024977 (2005-02-01), Ong
patent: 2005/0204223 (2005-09-01), Ong
patent: 2005/0236703 (2005-10-01), Kazi et al.
patent: 2005/0289428 (2005-12-01), Ong
patent: 2006/0152241 (2006-07-01), Ong
patent: 2007/0053236 (2007-03-01), Vogelsang
patent: 2007/0067687 (2007-03-01), Ong
patent: 2007/0079204 (2007-04-01), Ong
Office Action with English Translation dated Jun. 1, 2009, for Taiwan Patent Application No. 092132923. 11 pages.
U.S. Non-Final Office Action with mail date of Sep. 22, 2009 re U.S. Appl. No. 11/552,944 filed on Oct. 25, 2006. 23 pages.

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