Testing fixture and method for circuit traces on a flexible subs

Details Testing fixture and method for circuit traces on a flexible subs Testing fixture and method for circuit traces on a flexible subs

1994-03-29

1995-11-14

Regan, Maura K.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324754, 324690, G01R 3102

Patent

active

054670209

ABSTRACT:
A mechanism is provided for testing circuit traces extending along a flexible substrate, which is fed in a longitudinal direction between an upper plate and a lower plate. The upper plate includes a number of upper apertures extending across the flexible substrate and a number of upper segments, also extending across the flexible substrate, between adjacent apertures. The lower plate includes lower segments extending under the upper apertures and lower apertures extending under the upper segments. Two upper test probes are moved above the flexible substrate, while two lower test probes are moved under the flexible substrate. Tests are applied to both sides of the flexible substrate as the probes are brought into contact with test points in the areas accessible through the upper and lower apertures, with segments extending along the apertures on the opposite sides of the flexible substrate providing a backing surface for probe contact. A two-probe method may be used to determine the electrical characteristics of a circuit trace extending between test points, or a single-probe method may be used to determine the capacitance between a circuit trace and the plates. Circuit areas on the substrate are moved between the plates in a series of incremental motions to expose various points through the apertures as required to complete the testing process.

REFERENCES:
patent: 3009101 (1961-11-01), Locher
patent: 4155173 (1979-05-01), Sprandel
patent: 4786867 (1988-11-01), Yamatsu
patent: 4934064 (1990-06-01), Yamaguchi et al.
patent: 4943767 (1990-07-01), Yokota
patent: 4987365 (1991-01-01), Shreeve et al.
patent: 5138266 (1991-08-01), Stearns
patent: 5189363 (1993-02-01), Bregman et al.
patent: 5237268 (1993-08-01), Honma et al.

Affiliated with

Also associated with

Rating

Testing fixture and method for circuit traces on a flexible subs does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing fixture and method for circuit traces on a flexible subs, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing fixture and method for circuit traces on a flexible subs will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1223528