Testing ESD protection schemes in semiconductor integrated circu

Details Testing ESD protection schemes in semiconductor integrated circu Testing ESD protection schemes in semiconductor integrated circu

1997-11-18

1999-11-02

Sherry, Michael J.

Electricity: electrical systems and devices

Safety and protection of systems and devices

Transient responsive

361 56, 324686, 324713, H02H 322

Patent

active

059781971

ABSTRACT:
Circuitry for testing and comparing ESD protection structures is provided on a semiconductor integrated circuit. Analysis of charge transmitted to a test capacitor on board the chip provides for improved accuracy in evaluating performance of the ESD protection structure. Moreover, multiple ESD structures can be implemented and accurately compared to one another on a test chip as described. The disclosed methods and apparatus are usefull in reduced turn-around time and more accurate evaluation and comparison of ESD protection structures in integrated circuits.

REFERENCES:
patent: 5410254 (1995-04-01), Consiglio
patent: 5523699 (1996-06-01), Miyagawa
patent: 5786700 (1998-07-01), Jen et al.

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