Testing embedded arrays in large scale integrated circuits

Details Testing embedded arrays in large scale integrated circuits Testing embedded arrays in large scale integrated circuits

1980-12-10

1983-09-13

Tokar, Michael J.

Electricity: measuring and testing

Plural, automatically sequential tests

324 73AT, G01R 1512

Patent

active

044045190

ABSTRACT:
An integrated circuit chip having an embedded array which is not directly accessible from the primary input/output chip pins is manufactured with additional test circuitry directly on the chip, such that the performance of the array may be physically tested from the input/output pins by an external chip tester while the array remains embedded. Because of the added test circuitry, tests are not limited to the original chip architecture, and a variety of array tests may be made by an external tester without redesigning the chip architecture.

REFERENCES:
patent: 3961252 (1976-06-01), Eichelberger
patent: 3961254 (1976-06-01), Cavaliere

Affiliated with

Also associated with

Rating

Testing embedded arrays in large scale integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Testing embedded arrays in large scale integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing embedded arrays in large scale integrated circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1732352