Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-02-11
2010-06-01
Nguyen, Hoai-An D (Department: 2831)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S763010, C702S117000
Reexamination Certificate
active
07728604
ABSTRACT:
A test setup is provided to test differential signals outputs from the I/O block (IOB) pairs in an integrated circuit (IC). The test setup allows elimination of the external 100 Ohm resistors provided across the differential outputs on a device under test (DUT) test board containing the IC by taking advantage of a 100 Ohm resistor built into the IC between a portion of the IOB pairs. An IOB pair being tested may have its differential output terminal pair shorted to the differential output terminal pair of the IOBs having the internal 100 Ohm resistor.
REFERENCES:
patent: 6182163 (2001-01-01), Yamashita et al.
patent: 6777946 (2004-08-01), Ott
patent: 6847203 (2005-01-01), Conti et al.
patent: 6876218 (2005-04-01), Simmons et al.
patent: 6931344 (2005-08-01), Gotoh et al.
Lai Andrew W.
Sadler Brian
Simmons Michael Leonard
Simmons Tuyet Ngoc
Nguyen Hoai-An D
Ward Thomas A.
XILINX Inc.
LandOfFree
Testing differential signal standards using device under... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testing differential signal standards using device under..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing differential signal standards using device under... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4189078