Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-02-07
2006-02-07
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090
Reexamination Certificate
active
06995582
ABSTRACT:
A testing device for a semiconductor component including at least one first contact. The testing device contains at least one second contact for producing an electrical connection to the first contact. The second contact is immobile relative to the testing device.
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Schweiger Dieter
Würzinger Mathias
Greenberg Laurence A.
Infineon - Technologies AG
Locher Ralph E.
Nguyen Vinh P.
Stemer Werner H.
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