Testing device for testing electronic device and testing...

Details Testing device for testing electronic device and testing... Testing device for testing electronic device and testing...

2004-04-14

2008-07-08

Payne, David C. (Department: 2611)

Pulse or digital communications

Testing

Phase error or phase jitter

C370S516000, C375S224000, C375S371000, C375S376000, C398S155000, C398S175000, C714S704000

Reexamination Certificate

active

07397847

ABSTRACT:
A testing device for testing an electronic device is provided. The testing device includes: a deterministic jitter application unit for applying deterministic jitter to a given input signal without causing an amplitude modulation component and supplying the input signal with the deterministic jitter to the electronic device; a jitter amount controller for controlling the magnitude of the deterministic jitter generated by the deterministic jitter application unit; and a determination unit for determining whether or not the electronic device is defective based on an output signal output from the electronic device in accordance with the input signal.

REFERENCES:
patent: 5793822 (1998-08-01), Anderson et al.
patent: 2003/0202573 (2003-10-01), Yamaguchi et al.
Trischitta et al.; The Jitter Tolerance of Fiber Optic Regenerators; Dec. 1987; IEEE TRansactions on Communications; pp. 1303-1308.

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