Testing device

Details Testing device Testing device

2008-04-15

2008-04-15

Cosimano, Edward R (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C324S073100, C324S537000, C324S763010, C702S108000, C702S117000, C702S118000, C702S119000, C702S124000, C702S186000, C714S724000, C714S738000, C714S742000

Reexamination Certificate

active

07359822

ABSTRACT:
A testing device that tests an electronic device includes a test pattern outputting unit operable to output a test pattern to the electronic device, a deciding unit operable to decide whether an output signal from the electronic device satisfies a predetermined condition, an instruction storing unit operable to store a plurality of instruction codes, a first instruction pipeline operable to generate a condition satisfaction instruction stream including a plurality of instructions that causes the test pattern outputting unit to output the test pattern to be supplied to the electronic device when the output signal satisfies the condition based on the plurality of instruction codes, a second instruction pipeline operable to generate a condition non-satisfaction instruction stream including a plurality of instructions that causes the test pattern outputting unit to output the test pattern to be supplied to the electronic device when the output signal does not satisfy the condition based on the plurality of instruction codes, and a selection unit operable to select which of the condition satisfaction instruction stream or the condition non-satisfaction instruction stream is supplied to the test pattern outputting unit based on the result decided by the deciding unit.

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