Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
Reexamination Certificate
2006-01-26
2008-09-23
Barnie, Rexford (Department: 2819)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Circuit tuning
C702S085000, C326S021000, C326S031000, C327S538000
Reexamination Certificate
active
07428465
ABSTRACT:
Systems and methods for Current Management of Digital Logic Devices are provided. In one embodiment a method for calibrating a digital logic circuit current management system is provided. The method comprises activating one or more synchronous logic paths of a plurality of synchronous logic paths within the digital logic integrated circuit; sampling a voltage powering the digital logic integrated circuit while activating the one or more synchronous logic paths; storing one or more data samples representative of the sampled voltage; and calculating a bypass current setpoint based on the one or more data samples, wherein the bypass current setpoint specifies one or more bypass current characteristic to prevent the voltage powering the digital logic integrated circuit from dropping below a reference voltage.
REFERENCES:
patent: 6040707 (2000-03-01), Young et al.
patent: 6967853 (2005-11-01), DeFazio et al.
patent: 7076384 (2006-07-01), Radulov et al.
Bingel Thomas J.
Tran Deanne
Barnie Rexford
Crawford Jason M
Honeywell International , Inc.
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