Testing circuits for degradation without removal from host...

Details Testing circuits for degradation without removal from host... Testing circuits for degradation without removal from host...

2011-06-07

2011-06-07

Hollington, Jermele M (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07956617

ABSTRACT:
A system (S) for testing of electronic circuits (14) includes at least one input signal (18) influenced by the tested circuit (14) for generating a resultant signal (22) conveying characteristics of selected critical performance parameters from the tested circuit (14). A reference circuit (80) receives comparable test signals (19) and produces a reference resultant signal (23). A comparator block circuit (82) further generates an output signal (52) that results from an application of selected comparison criteria to the signals (22and23). The output signal (52) is reflective of desired performance of the electronic circuit (14) that is tested and deterioration with time is detected by analysis and comparison with the results of previous tests.

REFERENCES:
patent: 6940296 (2005-09-01), Yamada
patent: 2005/0264300 (2005-12-01), Chang et al.

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