Testing circuit for measuring a frequency of signal output...

Details Testing circuit for measuring a frequency of signal output... Testing circuit for measuring a frequency of signal output...

2006-05-25

2010-06-01

Liu, Shuwang (Department: 2611)

Pulse or digital communications

Testing

Phase error or phase jitter

C375S145000, C375S213000, C375S215000, C375S294000, C375S377000

Reexamination Certificate

active

07729418

ABSTRACT:
A testing circuit measures a center frequency of a clock signal outputted by a clock generator. The clock generator has a frequency modulator capable of (1) performing a frequency sampling accurately for the duration of modulation frequency and reducing the duration for frequency measurements, and (2) implementing proper testing of the down-spread controlling feature as one of the SSCG modulation functions by accurately determining the center frequency of the clock signal. The testing circuit measures a center frequency of a clock signal outputted by a clock generator by converting an analog modulation signal into a digital signal and outputting the digital signal, counting the period of the clock signal to obtain a count according to the digital signal outputted by the clock generator, and comparing the count with the predetermined specification values related to the center frequency of the clock signal to obtain and output a comparison result.

REFERENCES:
patent: 4143362 (1979-03-01), Ulmer
patent: 5668480 (1997-09-01), Nintzel
patent: 6150963 (2000-11-01), Boscolo et al.
patent: 63-187949 (1988-08-01), None

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