Testing circuit for a data interface

Details Testing circuit for a data interface Testing circuit for a data interface

2008-07-22

2008-07-22

Nguyen, Vincent Q (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S538000, C714S043000

Reexamination Certificate

active

07403021

ABSTRACT:
A testing circuit for an interface includes a load feeding circuit and a voltage testing circuit. The load feeding circuit includes a resistance-regulating unit, a first comparator, a pass element, and a capacitor. The resistance-regulating unit is connected to a positive input of the first comparator. A negative input of the first comparator is connected to the capacitor and a first terminal of the pass element. An output of the first comparator is connected to a second terminal of the pass element. A third terminal of the pass element is connected to the interface. The voltage testing circuit includes a second comparator and a display member connected to the second comparator. The voltage of the interface and a reference voltage are input to inputs of the second comparator, and the second comparator outputs a signal to control the display member to display a comparison result.

REFERENCES:
patent: 4149160 (1979-04-01), Bozarth et al.
patent: 6323694 (2001-11-01), Creek
patent: 6785853 (2004-08-01), Takahashi
patent: 6829726 (2004-12-01), Korhonen
patent: 6940303 (2005-09-01), Vargas
patent: 2004/0102917 (2004-05-01), Chen et al.

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