Testing circuit and testing method for liquid crystal...

Details Testing circuit and testing method for liquid crystal... Testing circuit and testing method for liquid crystal...

2005-11-23

2008-10-21

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

Reexamination Certificate

active

07439756

ABSTRACT:
A testing circuit and a test method for a liquid crystal display device are provided. The testing circuit for the liquid crystal display device employs p shorting bars to test subpixels of pixel cells formed on a substrate. The p shorting bars are respectively connected to (p×m+1)th, (p×m+2)th, (p×m+3)th . . . , (p×m+p)th numbered signal paths of the plurality of the signal paths, and when n is odd, p=2×n; when n is even, p=n; with m being zero or a positive integer.

REFERENCES:
patent: 6392719 (2002-05-01), Kim
patent: 6982569 (2006-01-01), Lee et al.
patent: 2002/0047820 (2002-04-01), Ha
patent: 2002/0089614 (2002-07-01), Kim

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