Testing circuit

Details Testing circuit Testing circuit

1975-02-25

1976-08-24

Rolinec, R. V.

Electricity: measuring and testing

Plural, automatically sequential tests

23515131, 235153AC, G01R 1512, G01R 3100

Patent

active

039769402

ABSTRACT:
An improved testing circuit is provided which includes a pair of comparator circuits each of which is disposed for comparing two minimum threshold amplitudes of responses from a device under test, and a multiplexer circuit coupled to the outputs of the pair of comparator circuits for switching between the outputs of the pair of comparator circuits. The use of a pair of comparator circuits and a multiplexer circuit allows continuous operation of the comparators thereby providing accurate testing at high speeds of operation.
The improved testing circuit of this invention also includes a skew adjustment circuit which provides for adjustment of the leading and trailing edges of a test stimuli signal from one testing circuit with respect to the leading and trailing edges of test stimuli signals from other testing circuits incorporated in a circuit testing system. Undesired glitches have been substantially eliminated from the test stimuli signal by incorporation of an amplitude limiting circuit that mitigates the amplitude of switching signals used in generating the test stimuli signal.

REFERENCES:
patent: 3772595 (1973-11-01), De Wolf et al.
patent: 3832535 (1974-08-01), De Vito
patent: 3849726 (1974-11-01), Justice
patent: 3851161 (1974-11-01), Sloop
patent: 3882386 (1975-05-01), VINSANI
B394,712, Jan., 1975, Patti, 324/73 R

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