Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1998-02-04
1999-10-05
Do, Diep N.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324761, 73815, 73588, G01R 3102
Patent
active
059630396
ABSTRACT:
An apparatus for testing the attachment reliability of a device mounted at least by an electrically conducting joint to a surface of a circuit board is provided. The apparatus includes an environmental chamber in which the board can be placed; an actuator for applying a force to the device; an electrical monitoring unit for monitoring any events at the electrically conducting joint; and a memory unit for storing an event profile that includes information related to the events. The apparatus may further include a processing unit for characterizing the quality of the electrically conducting joint based on the stored event profile and for performing various other functions. A method for testing the attachment reliability of the device is also provided.
REFERENCES:
patent: 4218922 (1980-08-01), Ensminger
patent: 4287766 (1981-09-01), Emsminger
patent: 5533398 (1996-07-01), Sakurai
patent: 5744975 (1998-04-01), Notohardjono et al.
patent: 5828568 (1998-11-01), Dickinson et al.
patent: 5850146 (1998-12-01), Shim et al.
Borutta Richard
Burack John J.
Manock John C.
Occhipinti Michael V.
Do Diep N.
Lucent Technologies - Inc.
LandOfFree
Testing attachment reliability of devices does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Testing attachment reliability of devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Testing attachment reliability of devices will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1175606