Testing asynchronous processes

Details Testing asynchronous processes Testing asynchronous processes

1988-05-03

1992-03-17

Shaw, Dale M.

Excavating

371 27, 371 61, G06F 1100, G01R 3128

Patent

active

050974688

ABSTRACT:
An asynchronous chip is tested functionally by clocking it at a rate slower than its specified rate while applying test vectors at times selected so that synchronized signals guaranteed on the chip will be predictable. Testing of the chip at the specified rate is accomplished on a section-by-section basis.

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patent: 4649539 (1987-03-01), Crain et al.
patent: 4656592 (1987-04-01), Spaanenburg et al.
Chappell, "Automatic Test Generation for Asynchronous Digital Circuits" Bell System Technical Journal, vol. 53, No. 8, Oct. 1974, pp. 1477-1503.
Fujieda et al., "Testing Asynchronous Devices" Digest of Papers: International Test Conference 1987; IEEE Cat. No. 87CH2437-2, pp. 871-875.

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