Testing arrangement to distribute integrated circuits

Details Testing arrangement to distribute integrated circuits Testing arrangement to distribute integrated circuits

2006-09-26

2006-09-26

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07112979

ABSTRACT:
Arrangements having integrated circuit (IC) voltage and thermal resistance designated on a per IC basis.

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